Design And Simulation Noise Characteristics of AlGaN/GaN/AlGaN/GaN HEMT on SIC Substrate For Low Noise Applications
نویسندگان
چکیده
منابع مشابه
Generation-Recombination Defects In AlGaN/GaN HEMT On SiC Substrate, Evidenced By Low Frequency Noise Measurements And SIMS Characterization
Wide bandgap devices such as AlGaN/GaN High Electron Mobility Transistors (HEMT) grown on silicon carbide (SiC) substrate are investigated. Low frequency noise (LFN) measurements have been carried out to evaluate the structural perfection of dual gated HEMT devices featuring 0.25x2x75μm2 gate area: generation-recombination (GR) processes are evidenced. Two sets of GRbulges related respectively ...
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A 3.5 GHz Low-Noise Amplifier in 0.35 μm GaN HEMT on Si-Substrate for WiMAX Applications
This paper presents an 3.5 GHz low noise amplifier that uses a two-stage configuration, using 0.35 m AlGaN/GaN HEMT on silicon substrate technology. The first stage has a cascode topology to achieve high gain, better stability and well reverse isolation. The second stage has a RC-feedback topology for wideband matching. The Tmatching network is used for broadband output matching. The results s...
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ژورنال
عنوان ژورنال: IOSR Journal of Electrical and Electronics Engineering
سال: 2016
ISSN: 2320-3331,2278-1676
DOI: 10.9790/1676-1105023741